AIC.

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MIL-DTL-27467B

FIGURE 2. H-154A/AIC wiring diagram.

3.6 Environmental tests.

3.6.1 Temperature. When tested there shall be no parts cracked or deformed due to extreme temperature and the

DC resistance of the headset circuit requirements of 3.5.1.2 shall be met (see 4.6.1).

3.6.2 Vibration. When tested, there shall be no loose parts or evidence of mechanical failure and the dc resistance

of the headset circuit requirements of 3.5.1.2 shall be met (see 4.6.2).

3.6.3 Shock. When tested, there shall be no failure due to broken or deformed parts and the dc resistance of the

headset circuit requirements of 3.5.1.2 shall be met (see 4.6.3).

3.6.4 Humidity. When tested, there shall be no failure due to moisture or corrosion and the dc resistance of the

headset circuit requirements of 3.5.1.2 shall be met (see 4.6.4).

3.6.5 Salt fog. When tested, there shall be no failure due to corrosion, and the dc resistance of the headset circuit

requirements of 3.5.1.2 shall be met (see 4.6.5).

3.7 Marking. Marking shall be in accordance with MIL-STD-1285. Location shall be as specified (see 3.1) and

shall consist the following:

a. NSN.

b. PIN.

c. Manufacturer's CAGE and PIN.

3.8 Workmanship. The products shall be processed as to be uniform in quality and shall be free from loose or

deposited foreign materials and other defects that will affect life, serviceability, or appearance.