MIL-DTL-5589E
TABLE IV. Group A, zero defect sampling plan.
Lot size
Sampling size 1/
2 to
8
100 percent
9 to
150
13
151 to
280
20
281 to
500
29
501 to 1,200
34
1,201 to 3,200
42
3,201 to 10,000
50
10,001 to 35,000
60
1/ If lot size is smaller than sample size, test
all of the units.
4.5.1.3 Group B inspection. Group B inspection shall consist of the examinations and tests specified in
table V in the order shown, and shall be made on sample units which have been subjected to and have
passed the group A inspection.
4.5.1.3.1 Sampling plan. A sample of parts shall be randomly selected in accordance with table VI. If
one or more defects are found, the lot shall be rescreened and defects removed. After screening and
removal of defects, a new sample of parts shall be randomly selected in accordance with table VI. If one
or more defects are found in this second sample, the lot shall be rejected and shall not be supplied to the
specification.
TABLE V. Group B inspection.
Inspection
Requirement
Test method
paragraph
paragraph
Dielectric withstanding voltage
3.4.4
4.6.5
Stray magnetic field
3.4.5
4.6.6
TABLE VI. Group B, zero defect sampling plan.
Lot size
Sample size
2 to
50
5
1/
51 to
90
7
91 to
150
11
151 to
280
13
281 to
500
16
501 to 1,200
19
1,201 to 3,200
23
3,201 to 10,000
29
10,001 to 35,000
35
1/ If lot size is smaller than sample size, test
all of the units.
8
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business