MIL-PRF-25670B
4.4.1.2.1 Sampling plan. A sample of parts shall be randomly selected in accordance with table
II. If one or more defects are found, the lot shall be rescreened and defects removed. After screening
and removal of defects, a new sample of parts shall be randomly selected in accordance with table II.
If one or more defects are found in the second sample, the lot shall be rejected and shall not be
supplied to this specification. Reinspected lots shall be clearly identified.
TABLE II. Group A inspection.
Inspection
Requirement
Test method
paragraph
paragraph
Visual and mechanical
3.3, 3.4, 3.6, and 3.7
4.5.1
examination
Frequency response
3.5.1
4.5.2
Sensitivity
3.5.2
4.5.3
Impedance
3.5.3
4.5.4
Harmonic distortion
3.5.4
4.5.5
TABLE III.
Group A, zero defect sampling plan.
Lot size
Sample size
2 to 8
100 percent
9 to 15
13
16 to 25
13
26 to 50
13
51 to 90
13
91 to 150
13
151 to 280
20
281 to 500
29
501 to 1,200
34
1,201 to 3,200
42
3,201 to 10,000
50
4.4.1.3 Group B inspection. Group B inspection shall consist of the examinations and tests
specified in table IV in the order shown, and shall be made on sample units which have been
subjected to and have passed the group A inspection.
4.4.1.3.1 Sampling plan. A sample of parts shall be randomly selected in accordance with table
II. If one or more defects are found, the lot shall be rescreened and defects removed. After screening
and removal of defects, a new sample of parts shall be randomly selected in accordance with table II.
If one or more defects are found in the second sample, the lot shall be rejected and shall not be
supplied to this specification. Reinspected lots shall be clearly identified.
TABLE IV. Group B inspection.
Inspection
Requirement
Test method
paragraph
paragraph
Dielectric withstanding
3.5.5
4.5.6
8
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